Analytical Services
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Trillion
Science Inc.
Atomic Force Microscope (AFM)
- Surface morphology with atomic resolution
- Height profile
- Adhesion property
- Surface roughness
- For applications including data storage, carbon nanotube, DNA, photovoltaic and polymer
- Artifact Free Imaging by Crosstalk Elimination: Two independent, crossed-loop XY and Z flexure scanners for sample and tip.
- Flat and linear XY scan of up to 50 um x 50 um
- Accurate height measurements: 12 um Z-scan
- Ultimate AFM Resolution by True Non-Contact Mode: minimized sample damage or modification
Please contact our representatives to discuss your service needs at (510) 818-8588 or analyticalservice@trillionscience.com
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